Influence of Processing on the Structural and Transport Properties of PLZT Systems
Author : Vijendra A Chaudhari
Abstract :
Polycrystalline samples of the solid-solution series (Pb₁₋ₓLaₓ)(Zr₁₋ᵧTiᵧ)₁₋₀.₂₅ₓO₃, for x = 0.02, 0.04, 0.06, 0.08, and 0.10, were synthesized using the solid-state reaction technique. Structural, morphological, and dielectric characterization studies were performed for all the samples. Structural phase analysis was carried out using X-ray powder diffraction. All samples in the solid-solution series (PLZT) exhibited a rhombohedral single phase in the concentration range 0.02 ≤ x ≤ 0.06, whereas the samples with x = 0.08 and 0.10 showed a cubic phase. Microstructural studies for all the samples were conducted using SEM. The SEM analysis revealed nearly uniform grain distribution, indicating a uniform microstructure with no abnormal grain growth.
Dielectric studies—dielectric constant (ε) and tangent loss (tan δ)—measured as a function of temperature (from room temperature (RT) to 900 K) at different frequencies showed that the compounds undergo a diffuse-type ferroelectric–paraelectric phase transition. Diffusivity analysis of the phase transition yielded values between 1 and 2, indicating variation in the degree of disorder within the system.
Keywords :
PLZT ceramics, Diffuse Phase Transition, Relaxor Ferroelectrics, X-ray Diffraction, Dielectric Characterization.
